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Low-End Properties, Inc., hires AOK Construction Company to renovate the interior of Low-End’s office building. AOK sub­mits plans that Low-End approves. AOK completes the major recon­struction, paints the interior, and buys the fixtures and furnishings. Low-End rejects some of the furnishings because they do not match the plans, and subsequently refuses to allow AOK to finish the work or to col­lect payment. Could AOK sue successfully for payment for the entire contract? Yes/No and explain your legal reasoning.

Drainage & Irrigation Equipment, Inc., contracts to sell its assets to Earth & Sky Aquatic Corporation. Before either party has performed, rescission of this contract requires

In an XRD experiment, Michelle obtained a (400) diffraction peak for Si(100) crystal at a diffraction angle of

For the detection of X-ray fluorescence using WDS, detection of lower Z atoms generally requires the use of crystals with larger interplanar spacing.

Which of the following material information is generally beyond the capability of small-angle X-ray scattering?

XRD experiments (in the

Which of the following three statements on the advantage(s) of neutron diffraction over X-ray diffraction is/are true? (i) Neutron diffraction has improved sensitivity to low-Z elements such as C and H than X-ray diffraction. (ii) While both X-ray diffraction and neutron diffraction can be used to determine the lattice periodicity, neutron diffraction can provide additional information on the ordering of magnetic moments in a magnetic structure. (iii) Neutron diffraction has higher sensitivity to higher angle diffraction peaks than X-ray diffraction.

Which of the following techniques can provide the elemental composition information but not isotope information of a sample?

Consider various electron diffraction methods we have discussed in this course: LEED, RHEED, electron backscatter diffraction (EBSD) in SEM, and selective area diffraction (SAD) in TEM. Which one of the following statements on these electron diffraction methods is incorrect?

This is a bonus question. Show in the figure is the X-ray reflectivity pattern of a CuO (4 nm)/Cu (30 nm) bilayer structure deposited on a Si substrate surface (data from M. K. Tiwari, 2018). Which of the following statements or conclusions is incorrect?